Test racks for EOL communication tests
The complexity of the electronic products has led to the introduction of sophisticated communication buses and protocols. In this case, some of the DUT manufactured today use a specific software for its auto-test at the EOL. For this reason, the test of the communication lines is more necessary than ever.
On the other hand, current microcontrollers are bigger in regards of the memory requirements turning the time for reflashing the application in the manufacturing plant into a clear bottle-neck of the system. This is the main reason that has brought Generation RFID to develop a specific process and hardware to minimize the software reflashing time.
Multiple electronic products can be integrated in our solution, used as communication modules basis. Some examples are:
› LIN Protocol