Our products cover a wide range of mechanical and electronic DUT test necessities
Reliability and quality are the most requested qualities in any product that contains electronics. For this reason, Generation RFID has developed and placed into the market end-of-line (EOL) functional tester cores. Our standard microcontroller based DUT test solutions will fit your DUT test requirements in regards of coverage and time. The complexity of the Device Under Test (DUT) defines which is the most suitable choice, a Lynx10.000 or a Lynx300.1pro solution.
On the other hand, for any special requirements that could not be achieved with our current standard solutions, our R+D team develops Custom EOL Testers to perfectly fit your necessities and requirements in terms of cost, test time and functional coverage.
An important part of the test, especially for mechanical analysis, is the optical inspection (AOI). In regards of this, our experienced engineers will create the test you need for each Project.
All these products arise from our customers’ needs, therefore all of them are 100% suitable to the nowadays industry. Our Know-How has contributed to provide the designs with non-tangible aspects as:
› Test time optimization / minimization.
› Highest text coverage.
› Engagement: not only a supplier but more a partner.
› Tailor-made solutions.
› Affordable costs.
› Simple integrability.
› Beyond the specifications.